Work

Evaluation of point-source microscope localization accuracy based on measurement system analysis methods

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3037137

Authors: Xihong Fu, Zhiwei ZUO, Xuezhu LIN, Yetao YANG, Fan YANG, Hua LI, Zhiguo LI, Shifa KANG

Institutions: Xi'an Institute of Optics and Precision Mechanics, University of Chinese Academy of Sciences, Changchun University of Science and Technology

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404992913

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