Electrical Stress on Semiconductor Devices Mounted on PCB during Electrostatic Elimination by Corona Discharge Ionizer
Year: 2024
Type: article
DOI: 10.1002/tee.24245
Authors: Aguri Nakano, Makoto Okano, Takashi Terashige
Institution: Hiroshima International University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405013667