Work

Mechanism and Quantitative Modeling of the SRAM Soft Error Induced by Space Electrostatic Discharge

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3510716

Authors: R.-J. Yuan, Rui Chen, J.-W. Han, Y.-N. Liang, Z.-Y. Wang, H.-L. Yu

Institutions: Chinese Academy of Sciences, National Space Science Center

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China

Awards: G6459349739, G7628553028

OpenAlex ID: W4405022075

FWCI: 0.103

Cites: 35

Cited by: 1

Related to: 10