Work

Taper-Angle-Induced Variation in n/p-Stacked Versus p/n-Stacked CFET

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3506499

Authors: Eungyo Jang, Myongjin Kim, Changhwan Shin

Institution: Korea University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Research Foundation of Korea

Award: G623835629

OpenAlex ID: W4405022556

FWCI: 1.238

Cites: 16

Cited by: 12

Related to: 10