A Novel Insight Into the Vulnerability of DDR4 DRAM Cells Across Multiple Hammering Settings
Year: 2024
Type: article
Source: IEEE Embedded Systems Letters
Authors: Ranyang Zhou, Jacqueline Liu, Nakul Kochar, Sabbir Ahmed, Adnan Siraj Rakin, Shaahin Angizi
Institutions: New Jersey Institute of Technology, Binghamton University
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W4405056107
