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YOLO: An Improved High-Accuracy Method for PCB Defect Detection

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Computer Science and Network Technology (ICCSNT)

DOI: 10.1109/iccsnt62291.2024.10776686

Authors: Haitao Ge, Yong Shi, Mingyao Zhang, Yonggeng Wei, Hongshi Zhang, Xinxin Cao

Institution: Heilongjiang University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Heilongjiang University, National Natural Science Foundation of China

OpenAlex ID: W4405102893

FWCI:

Cites: 29

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Related to: 10