Work

Transmitter Fault Diagnosis Technology for High-Risk Complex Scenario

Year: 2024

Type: conference-paper

Source: International Conference on System Reliability and Safety Engineering (SRSE)

DOI: 10.1109/srse63568.2024.10772535

Authors: Lei Wang, Fengnan Zhang

Institution: Shenyang Institute of Technology

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405103798

FWCI: 0.722

Cites: 1

Cited by: 1

Related to: 10