Work

Optimized AI Methods for Rapid Crack Detection in Microscopy Images

Year: 2024

Type: article

Abstract: Detecting structural cracks is critical for quality control and maintenance of industrial materials, ensuring their safety and extending service life. This study enhances the automation and accuracy of crack detection in microscopic images using advanced image processing and deep learning techniques, particularly the YOLOv8 model. A comprehensive review of relevant literature was carried out to compare traditional image-processing methods with modern machine-learning approaches. The YOLOv8 model was optimized by incorporating the Wise Intersection over Union (WIoU) loss function and the bidirectional feature pyramid network (BiFPN) technique, achieving precise detection results with mean average precision ([email protected]) of 0.895 and a precision rate of 0.859, demonstrating its superiority in detecting fine cracks even in complex and noisy backgrounds. Experimental findings confirmed the model’s high accuracy in identifying cracks, even under challenging conditions. Despite these advancements, detecting very small or overlapping cracks in complex backgrounds remains challenging. Our future work will focus on optimizing and extending the model’s generalisation capabilities. The findings of this study provide a solid foundation for automatic and rapid crack detection in industrial applications and indicate potential for broader applications across various fields.

Source: Electronics

DOI: 10.3390/electronics13234824

Authors: Chenxukun Lou, Lawrence Tinsley, Fabian Duarte Martinez, Simon Gray, Barmak Honarvar Shakibaei Asli

Institutions: Cranfield University, Nanjing University of Aeronautics and Astronautics

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: gold

Estimated APC paid: $2,728