Work

Defect dependent electronic properties of two-dimensional transition metal dichalcogenides (2H, 1T, and 1T′ phases)

Year: 2024
Type: article
Abstract: reduced from 1.43 eV (1.31 eV with SOC) under GGA to a range of 0.98 eV to 0.06 eV, depending on the concentration. Our findings provide guidelines for experimental screening of 2D TMD defects, paving the way for the development of next-generation spintronic, electronic, and optoelectronic devices.
Language: English
Open Access status: hybrid
OpenAlex ID: W4405111770
FWCI: 3.595
Cites: 60
Cited by: 38
Related to: 10