Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers
Year: 2024
Type: article
Abstract: The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO 2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy E ≤ 10 keV. However, at higher E , the reflectivity and the resolution gradually deteriorate as E increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases at E > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X-ray absorption spectroscopy in high-energy-resolution fluorescence-detection mode or X-ray emission spectroscopy on 4 d transition metal compounds. Furthermore, the X-ray Raman features of the lithium K -edge in LiF and the oxygen K -edge feature in H 2 O, measured by nine Bragg analyzers (2 m radius) at E ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) at E ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed.
Source: Journal of Synchrotron Radiation
Author: Nozomu Hiraoka
Institution: National Synchrotron Radiation Research Center
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,890
OpenAlex ID: W4405130115