Work

TEM Characterization of Grain Boundaries in Mixed Bicrystal Films of Aluminum

Year: 2024

Type: article

Abstract: The structure and faceting behavior of near-90° <110> tilt grain boundaries in thin films of aluminum with a unique mazed bicrystal geometry is characterized by conventional, high resolution and high-voltage electron microscopy. In this microstructure the absence of triple junctions allows grain boundaries to facet in optimum orientation (inclination) during annealing. The degree of anisotropy of the boundaries is expressed in the form of a rose plot. Small local deviations in misorientation are shown to be necessary to accommodate optimum boundary segments. The crystallographic symmetry inherent in this microstructure is apparent and utilized throughout the analysis.

Source: OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Author: Dahmen, U. [Lawrence Berkeley Laboratory (LBL), Berkeley, CA (United States)]; Westmacott, K. H. [Lawrence Berkeley Laboratory (LBL), Berkeley, CA (United States)]

Institution: Lawrence Berkeley National Laboratory

Language: English

Topic: Microstructure and mechanical properties

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: green

Funders: U.S. Department of Energy, Basic Energy Sciences

Awards: G1398330795, G1643223109, G193590374, G301008592, G3444594369

OpenAlex ID: W4405168859

FWCI:

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