Work

Comparative Analysis of Layer Thickness Measurement Methods for Photovoltaic Modules: A Comprehensive Study

Year: 2024

Type: article

Abstract: Layer Thickness Measurement Methods for Photovoltaic Modules The image shows an optical setup that measures individual layers inside small single-cell photovoltaic test modules without contact. In the foreground, a 3D scan based on optical coherence tomography of a small section of the module is presented as a color map, clearly distinguishing individual layers such as the solar cell, grid fingers, busbars, and backsheet. More details can be found in article number 2400219 by Lukas Neumaier and co-workers.

Source: Advanced Energy and Sustainability Research

DOI: 10.1002/aesr.202470030

Authors: Lukas Neumaier, Martin De Biasio, Anika Gassner, Gabriele C. Eder, Thomas Nigl

Institutions: Silicon Austria Labs (Austria), TU Wien, Österreichisches Forschungsinstitut für Chemie und Technik, Montanuniversität Leoben

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: gold

Estimated APC paid: $3,400