Work

Design and Evaluation of a Radiation-Hardened FDSOI SRAM With High-Reliable Elements and Power Management Circuits for Space Application

Year: 2024

Type: article

Source: IEEE Transactions on Aerospace and Electronic Systems

DOI: 10.1109/taes.2024.3514604

Authors: Chang Cai, Minchi Hu, Lei Shen, Jun Yu, Gengsheng Chen

Institutions: Guangzhou University, Fudan University, State Key Laboratory of ASIC and System

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G488818869

OpenAlex ID: W4405232134

FWCI: 1.439

Cites: 26

Cited by: 14

Related to: 10