Work

A methodology for random placement of unit patterns to identify potential design and process optimizations

Year: 2024

Type: conference-paper

Source: International Workshop on Advanced Patterning Solutions (IWAPS)

DOI: 10.1117/12.3054474

Authors: jingjing Li, Yi Tong, Guangjian He, Junyu Lu, Yun Wang

Institution: Guangdong Greater Bay Area Institute of Integrated Circuit and System

Language: English

Topic: VLSI and FPGA Design Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405235481

FWCI:

Cites: 3

Cited by:

Related to: 10