EUV lithography imaging modeling and calculation based on full-vector beam propagation method
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3052229
Authors: Zhilong Zhong, Jiamin Liu, Pinxuan He, Hao Jiang, Honggang Gu, Shiyuan Liu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405236221
