Single-shot ionization-based monitor for pulsed electron beams
Year: 2024
Type: article
Source: Physical Review Applied
Authors: P. Denham, A. Ody, P. Musumeci, N. Burger, N. Cook, G. Andonian
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405237451
