A Relationship Between Semiconducting Thin Film's Electronic Structure Heterogeneity and Defect Tolerance
Year: 2024
Type: article
Source: Small Methods
Authors: Katarína Gmucová, Vojtech Nádaždy
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405260619
