A Defect Recognition Method for Switchgear Infrared Images Based on Improved YOLOv9s
Year: 2024
Type: conference-paper
Authors: Gengsen Wang, Ziyang Zhang, Ruilin Tang, Yuefan Wang, Haixia Ma, Zhongquan Gu
Institution: Guangzhou City University of Technology
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405272236