Work

Research on Anomaly Detection Algorithm Based on Pixel-level Histogram Distribution Variations of Integrated Features

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Digital Twins and Parallel Intelligence (DTPI)

DOI: 10.1109/dtpi61353.2024.10778741

Authors: Wendong Geng, Fenghua Zhu, Shichao Chen, Yisheng Lv, Gang Xiong

Institutions: Chinese Academy of Sciences, University of Chinese Academy of Sciences, Institute of Automation

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Research and Development

OpenAlex ID: W4405305109

FWCI: 0.721

Cites: 12

Cited by: 1

Related to: 10