Work

Application of big data analysis technology in industrial intelligent inspection system

Year: 2024

Type: conference-paper

Source: International Conference on Testing Technology and Automation Engineering (TTAE)

DOI: 10.1117/12.3055503

Author: Yiming Chen

Institution: Jilin University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405313938

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Cites: 15

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Related to: 10