Work

Research on the failure mechanism of closing resistance under impulse current

Year: 2024

Type: conference-paper

Source: International Conference on Testing Technology and Automation Engineering (TTAE)

DOI: 10.1117/12.3055376

Authors: YanYan Bao, Guangdong Zhang, Feng Wang, Dingjun Wen, Pin Jiang, Yu Zhan

Institutions: State Grid Corporation of China (China), Shanghai University of Electric Power

Language: English

Topic: Vacuum and Plasma Arcs

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405313990

FWCI: 2.5

Cites: 3

Cited by: 1

Related to: 10