Work

Research on influencing factors of surface morphology of InxGa1-xAs thin film on Si substrate

Year: 2024

Type: conference-abstract

Source: International Conference on Energy Materials and Electrical Engineering (ICEMEE)

DOI: 10.1117/12.3050197

Authors: Chengsi Lian, Shiyi Yuan, Yiheng Qi, Heng Wei, Han Yan, Peng Li

Institution: Wuhan University of Technology

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405314338

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