On measuring the number of passes of electrons through thin internal targets of a betatron
Year: 2024
Type: conference-paper
Abstract: The results of testing the method for measuring the number of passes of the betatron electron beam through a thin internal target are presented. The method is based on comparing the intensity of the characteristic X-ray radiation (CXR) emitted by a “thin” and “thick single-pass” targets.
Authors: S.R. Uglov, A.V. Vukolov, M.V. Shevelev
Institution: Tomsk Polytechnic University
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4405319878
