Work

Overview of defect detection techniques for high-voltage cable insulation layer materials

Year: 2024

Type: conference-paper

Source: International Conference on Optoelectronic Science and Materials (ICOSM)

DOI: 10.1117/12.3052603

Authors: Xingjian Zhang, Hao Ni, Yue Zou, Ting Chen

Institution: State Grid Corporation of China (China)

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405324649

FWCI:

Cites: 3

Cited by:

Related to: 10