Work

Research on automated test system for performance parameters of InGaAs PIN focal plane detectors

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3046533

Authors: Yingchun Xu, Jiafeng Qian, Chunrong Xiong, Zhihui Shen, Peng Yang, Weiji He

Institutions: China Electronics Standardization Institute, Nanjing University of Science and Technology, China Electronics Technology Group Corporation

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405359218

FWCI:

Cites: 2

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Related to: 10