Work

High-precision and traceable equipment for measuring aspheric mirror surface

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3047986

Authors: fan X. rui, Xiaofei Diao, Jianwei Wu, Yanhui Kang

Institutions: Harbin Institute of Technology, National Institute of Metrology

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405359241

FWCI: 0.229

Cites: 13

Cited by: 1

Related to: 10