Work

Automatic measurement of particle size based on scanning electron microscopy

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3048148

Authors: Lei Tao, Chong Yue, Jin Zhou, Jing Zheng, Wei Zhang

Institution: Chongqing Metrology Quality Inspection and Research Institute

Language: English

Topic: Image Processing Techniques and Applications

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405359855

FWCI:

Cites: 6

Cited by:

Related to: 10