Work

How Systolic Array Dataflow impacts on the resilience to hardware faults

Year: 2024

Type: conference-paper

DOI: 10.1109/dttis62212.2024.10780346

Authors: Salvatore Pappalardo, Bastien Deveautour, Alberto Bosio

Institutions: Lyon 1 Université, Centre National de la Recherche Scientifique, Institut des Nanotechnologies de Lyon, Institut National des Sciences Appliquées de Lyon, École d'Ingénieurs en Chimie et Sciences du Numérique

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agence Nationale de la Recherche

Award: REliable hardware for TRUSTworthy artificial INtelliGence

OpenAlex ID: W4405362053

FWCI: 0.779

Cites: 22

Cited by: 1

Related to: 10