Work

Integrated Testing Framework for μDMA Peripherals

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Signal Processing, Informatics, Communication and Energy Systems (SPICES)

DOI: 10.1109/spices62143.2024.10779696

Authors: Akza Baby, Thejus P Aditya, Adersh V R

Institution: College of Engineering Trivandrum

Language: English

Topic: Embedded Systems and FPGA Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405362520

FWCI:

Cites: 8

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Related to: 10