Work

Punch-through variability in buried channel transistors

Year: 2024

Type: conference-paper

DOI: 10.1109/dttis62212.2024.10780055

Authors: C. Belabbas, S. Perrin, R. Habhab, V. Della Marca, P. Masson, P. Canet, J-M. Portal, T. Kempf, N. Miridi, M. Mantelli, S. Niel, A. Regnier

Institutions: Centre National de la Recherche Scientifique, Aix-Marseille Université, Institut des Matériaux, de Microélectronique et des Nanosciences de Provence, STMicroelectronics (France), Université Côte d'Azur

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405363097

FWCI: 1.562

Cites: 17

Cited by: 2

Related to: 10