Work

In-Situ FPGA Fault Injection with Short-Circuits

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792722

Authors: Garren Dutto, Daniil Lytikov, Vincent Immler

Institution: Oregon State University

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405440237

FWCI: 0.883

Cites: 32

Cited by: 3

Related to: 10