Work

Data Remanence Vulnerabilities in Commercial SRAM at Low Temperature

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792674

Authors: Farzana Hoque, Izak Halseide, Aleksandar Milenkovic, Biswajit Ray

Institutions: University of Alabama in Huntsville, Colorado State University

Language: English

Topic: Security and Verification in Computing

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4405440300

FWCI: 1.268

Cites: 13

Cited by: 4

Related to: 10