Work

Applying a Trusted Microelectronics Post-Silicon Verification & Validation Workflow to Legacy Integrated Circuit Design Recovery

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792673

Authors: Jon Scholl, Noah Padro, Yash Patel, Tim McDonley, Adam R. Waite, John Kelley, Christian Eakins, Tamara Juntiff, Adam Kimura

Institutions: Battelle, United States Air Force Research Laboratory

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405440360

FWCI:

Cites: 22

Cited by:

Related to: 10