Work

Vision Transformers for Counterfeit IC Detection

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792793

Authors: Chaitanya Bhure, Dhruvakumar Aklekar, Wenjie Che, Fareena Saqib

Institutions: University of North Carolina at Charlotte, Howard University

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405440581

FWCI: 1.869

Cites: 23

Cited by: 6

Related to: 10