Work

Enhancing Product Assurance and Reliability through a Machine Learning-Based Data Analysis System

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792709

Authors: Dohun Kim, Wonjong Kim

Institution: Electronics and Telecommunications Research Institute

Language: English

Topic: Data Mining and Machine Learning Applications

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405440595

FWCI:

Cites: 31

Cited by:

Related to: 10