Work

Physical Layout Extraction via Ion Milling based IC Delayering for Reverse Engineering Applications

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792871

Authors: Shuvodip Maitra, Tishya Sarma Sarkar, Abhishek Chakraborty, Debdeep Mukhopadhyay

Institution: Indian Institute of Technology Kharagpur

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Research and Development

OpenAlex ID: W4405440630

FWCI: 0.621

Cites: 11

Cited by: 2

Related to: 10