Work

Success Thresholds for Power Analysis Attacks Across Multiple Data Encryption Standard (DES) Implementations on a Microcontroller

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792803

Authors: J. David Ingalls, Barrett Tieman, Andrew Lukefahr

Institutions: Indiana University Bloomington, NSWC Crane Division, Indiana University

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405440778

FWCI: 0.317

Cites: 12

Cited by: 1

Related to: 10