Work

Fault-Injection Countermeasures, Deployed at Scale

Year: 2024

Type: conference-paper

Source: IEEE Physical Assurance and Inspection of Electronics (PAINE)

DOI: 10.1109/paine62042.2024.10792790

Authors: Daniel Nemiroff, Carlos Tokunaga

Institution: Intel (United States)

Language: English

Topic: Security and Verification in Computing

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405440945

FWCI: 0.951

Cites: 3

Cited by: 4

Related to: 10