Year: 2024
Type: article
Abstract: Heterostructures containing thin tellurium layers thermally evaporated on differently doped GaAs substrates were systematically investigated by using THz pulse excitation spectroscopy. The observed differences of the THz excitation spectra were explained by the details of the energy band lineups in the heterostructures. Comparison of the simulation results of the heterojunction between tellurium and semi-insulating GaAs with the measured THz pulse emission spectrum allowed one to estimate the electron affinity in the tellurium layer. In addition, a near-infrared photodetector based on the Te heterojunction with n-type GaAs was demonstrated.
Source: Lithuanian Journal of Physics
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
Funder: Lietuvos Mokslo Taryba
Award: G5980146441
OpenAlex ID: W4405443472
