Work

SWM-YOLO: A New PCB Surface Defect Detection Algorithm Based on YOLOv8

Year: 2024

Type: conference-paper

Source: International Conference on Intelligent Informatics and Biomedical Sciences (ICIIBMS)

DOI: 10.1109/iciibms62405.2024.10792700

Authors: Ruijun Yang, Wen Zhao

Institution: Shanghai Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405490776

FWCI: 1.446

Cites: 6

Cited by: 2

Related to: 10