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Machine Vision Based Paper Defect Detection

Year: 2024

Type: conference-paper

Source: International Conference on Intelligent Informatics and Biomedical Sciences (ICIIBMS)

DOI: 10.1109/iciibms62405.2024.10792670

Authors: Junjie Xi, Zemin Fu, Zhifan Zhao

Institution: Shanghai Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405491126

FWCI: 0.755

Cites: 6

Cited by: 1

Related to: 10