Characterization of AlN and AlScN thin films CPW Transmission on High-Resistive Substrates
Year: 2024
Type: conference-paper
Authors: Kang Du, Fengyu Liu, Xuankai Xu, Tao Wu
Institution: ShanghaiTech University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405521422
