Work

PCB Defect Detection Method Based on G-YOLOv8

Year: 2024

Type: conference-paper

Source: International Conference on Cyber-Physical Social Intelligence (ICCSI)

DOI: 10.1109/iccsi62669.2024.10799473

Authors: Chao Gao, Mengting Bai, Xiaoqin Lian, Xiangyu Hu, Shuangshuang Han, Shichao Chen

Institutions: Beijing Technology and Business University, University of Science and Technology Beijing, Chinese Academy of Sciences, Institute of Automation

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405521439

FWCI: 6.484

Cites: 16

Cited by: 9

Related to: 10