Work

Trap density estimation for TDDB testing in SiC power MOSFETs

Year: 2024

Type: article

Source: Journal of Physics D Applied Physics

DOI: 10.1088/1361-6463/ada0c1

Authors: Houcai Luo, Kang Lu, Kai Zheng, Xianping Chen

Institutions: Chongqing University, State Key Laboratory of Power Transmission and Distribution Equipment and System Safety and New Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4405536190

FWCI: 0.103

Cites: 21

Cited by: 1

Related to: 10