Work

Optimal design of accelerated test under electrical stress

Year: 2024

Type: conference-paper

Source: IET conference proceedings.

DOI: 10.1049/icp.2024.4084

Authors: Fang Zhang, Wen-jie Fan, Yan-hui Zhu, Zhi Wang, Lin Su

Institutions: China Meteorological Administration, Chinese People's Liberation Army, State Intellectual Property Office

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4405546899

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