Work

Comparative study of how buffering spacer materials affect the reliability of double-sided cooling SiC power module by finite element modeling

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3056204

Authors: Jingyu Li, Xiaofei Pan, Zhifeng Shao, Xiankun Zhang, Sheng Gao, Sen Hong, Yi Huang, Yang Zuo

Institutions: Chongqing University of Posts and Telecommunications, China Resources (China), Guilin University of Electronic Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4405568184

FWCI:

Cites: 6

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Related to: 10