Research on reuse method of electronic product debugging process knowledge based on ontology model
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3056119
Author: Wen Lei Wen
Institution: China Electronics Technology Group Corporation
Language: English
Topic: Semantic Web and Ontologies
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405568191