Work

The Effect of Relative Humidity in Conductive Atomic Force Microscopy (Adv. Mater. 51/2024)

Year: 2024

Type: article

Abstract: Conductive Atomic Force Microscopy In article number 2405932, Yue Yuan and Mario Lanza clarify what is the effect of relative humidity in conductive atomic force microscopy. They measure over 17,000 different locations on the surface of ten different samples (insulating, semiconducting and conducting) under seven different relative humidity levels. In insulators and thick (>5 nm) semiconductors, the water meniscus at the tip/sample junction increases the currents registered.

Source: Advanced Materials

DOI: 10.1002/adma.202470411

Authors: Yue Yuan, Mario Lanza

Institutions: King Abdullah University of Science and Technology, National University of Singapore

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W4405599849

FWCI: 0.164

Cites:

Cited by: 1

Related to: 10