Work

Total Ionizing Dose Effects on the Performance and Hot Carrier Degradation of LDMOS Transistors

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3512480

Authors: Bikram Kishore Mahajan, Yen-Pu Chen, M. Asaduz Zaman Mamun, Muhammad Ashraful Alam

Institution: Purdue University West Lafayette

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4405600952

FWCI: 0.103

Cites: 29

Cited by: 1

Related to: 10