A Complete Condition Monitoring Method for SiC MOSFETs with BTI Recovery Function
Year: 2024
Type: conference-paper
Authors: Kaiwei Li, Pengju Sun, Lan Chen, Xinghao Zhou, Qingsong Liu, Chenhao Tang
Institution: Chongqing University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4405600970